Estimation of the Gilbert model parameters using the simulated annealing method

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DC Field	Value	Language
dc.contributor.author	Tan, TH	en_US
dc.contributor.author	Chang, WW	en_US
dc.date.accessioned	2014-12-08T15:02:30Z	-
dc.date.available	2014-12-08T15:02:30Z	-
dc.date.issued	1996-07-04	en_US
dc.identifier.issn	0013-5194	en_US
dc.identifier.uri	http://hdl.handle.net/11536/1170	-
dc.description.abstract	An estimation method based on the simulated annealing algorithm is proposed for computing the Gilbert model parameters from sample error sequences. Experimental results indicate that the simulated annealing method yields estimates which more closely match the experimental error statistics.	en_US
dc.language.iso	en_US	en_US
dc.subject	simulated annealing	en_US
dc.subject	error statistics	en_US
dc.title	Estimation of the Gilbert model parameters using the simulated annealing method	en_US
dc.type	Article	en_US
dc.identifier.journal	ELECTRONICS LETTERS	en_US
dc.citation.volume	32	en_US
dc.citation.issue	14	en_US
dc.citation.spage	1256	en_US
dc.citation.epage	1258	en_US
dc.contributor.department	交大名義發表	zh_TW
dc.contributor.department	電信工程研究所	zh_TW
dc.contributor.department	National Chiao Tung University	en_US
dc.contributor.department	Institute of Communications Engineering	en_US
dc.identifier.wosnumber	WOS:A1996UZ51000010	-
dc.citation.woscount	3	-
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