結合地電阻與薄膜界面感應器調查地下水DNAPLs之案例研究

Abstract

由於比水重之非水相液體(Dense non-aqueous phase liquid, DNAPL)之污染移動特性為垂直向下移動，因此遭受DNAPLs之污染場址較不容易調查出污染來源及污染範圍。爲了使DNAPLs污染位置可依SOP流程更容易調查出，本研究結合地電阻剖面影像法與薄膜界面感應器兩種調查技術，探討結合此2種技術進行階段性調查，可增加調查DNAPLs污染位置之準確率，並可間接節省調查成本的支出。 本研究篩選出3處調查案例，探討各場址之製程特性、區域水文地質及污染潛勢位置，並探討各場址之調查技術及調查成本分析，且模擬單種技術調查A場址。 透過本研究得知，透過結合地電阻與薄膜界面感應器的方式調查污染場址，並比對地電阻剖面影像法所探測出地層電阻值，與薄膜界面感應器調查技術所探測出ECD及FID之偵測值，可提高判定污染區域之準確性，並節省後續採樣檢測之成本。

Dense non-aqueous phase liquids (DNAPLs) feature in vertical contamination; therefore, it is relatively difficult to their origin and extend. In order to getting a faster and easier way to find the location of contaminants, the investigations by two approaches: ground resistance and membrane interface sensor have been conducted and compared. Firstly, three sites raised great concern in Taiwan have been selected. Hydrology, geology, and potential locations for three sites which were potentially contaminated by DNAPLs have been investigated. The comparisons of site-investigation techniques as well as their costs are also included. In conclusion, with the combination of Resistivity Image Profiling (RIP) and Membrane interface probe (MIP), the work of groundwater-investigation could be done by the enhanced precision and cost down.