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dc.contributor.author陈逸帆en_US
dc.contributor.authorI-Fan Chenen_US
dc.contributor.author李建平en_US
dc.contributor.authorChien-Ping Leeen_US
dc.date.accessioned2014-12-12T02:28:04Z-
dc.date.available2014-12-12T02:28:04Z-
dc.date.issued2001en_US
dc.identifier.urihttp://140.113.39.130/cdrfb3/record/nctu/#NT900428017en_US
dc.identifier.urihttp://hdl.handle.net/11536/68711-
dc.description.abstract以量子点当作主动层的半导体雷射,称为量子点雷射,由于是三维方向都被局限的形况,理论上会有分离(discrete)的能态密度,有很高的差动增益(differential gain),所以我们可以预期量子点雷射会有很低的起始电流,很高的特征温度,很窄的光谱,和很大的调变频宽,有很好的雷射特性。
本实验我们以InAs/GaAs材料拿来做成自聚性的量子点,实验主要研究了基底厚度对光频谱的影响,实际上量子点雷射的频谱是非常复杂的,有了这样的一个认知,我们能够在去除基底厚度对频谱的影响条件下,再更进一步深入的的研究量子点频谱的特性。且量子点雷射对温度及电流也极为敏感,这也是值得研究的,同时藉由量测雷射其他特性的变化,能更进一步了解复杂的量子点结构。
zh_TW
dc.description.abstractThe quantum-dot lasers are semiconductor lasers which use Quantum-dot as their active region medium. Because electrons in quantum-dots are confined in three dimensions and have discrete energy density of state theoretically , quantum dot lasers are predicted to have very low threshold current density , high characteristic temperature and narrow bandwith ..etc.
In this paper , we mainly investgate the effect of the thickness of the GaAs substrste to quantum dot lasers . Besides, we investgate the factors which affect the characters of QD lasers like cavity length and temperature..etc. The results indicate that the dominant mechanism leading to the regular modulation of the emission spectra in these quantum-dot lasers is related to the device thickness,although there some additional features present in some of the measured spectra that do not appear to be related to the cavity length or thickness. It may be that in quantum-dot devices where substrate effects are suppressed that other mechanism cause regular or quasiregular mode distribution.
en_US
dc.language.isozh_TWen_US
dc.subject量子点zh_TW
dc.subject量子点雷射zh_TW
dc.subject雷射zh_TW
dc.subjectQuantum doten_US
dc.subjectQuantum dot lasersen_US
dc.subjectlaseren_US
dc.title量子点雷射之研究zh_TW
dc.titleStudies of Quantum Dot Lasersen_US
dc.typeThesisen_US
dc.contributor.department电子研究所zh_TW
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