Browsing by Author Chan, KT

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Showing results 3 to 11 of 11 < previous 
Issue DateTitleAuthor(s)
1-Apr-2002Frequency-dependent capacitance reduction in high-k AlTiOx and Al2O3 gate dielectrics from IF to RF frequency rangeChen, SB; Lai, CH; Chan, KT; Chin, A; Hsieh, JC; Liu, J; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Sep-2003High-performance microwave coplanar bandpass and bandstop filters on Si substratesChan, KT; Chin, A; Li, MF; Kwong, DL; McAlister, SP; Duh, DS; Lin, WJ; Chang, CY; 電子工程學系及電子研究所; 電信工程研究所; Department of Electronics Engineering and Institute of Electronics; Institute of Communications Engineering
1-Nov-2003Integrated antennas on Si with over 100 GHz performance, fabricated using an optimized proton implantation processChan, KT; Chin, A; Lin, YD; Chang, CY; Zhu, CX; Li, MF; Kwong, DL; McAlister, S; Duh, DS; Lin, WJ; 電子工程學系及電子研究所; 電信工程研究所; Department of Electronics Engineering and Institute of Electronics; Institute of Communications Engineering
2003Low RF loss and noise of transmission lines on Si substrates using an improved ion implantation processChan, KT; Chin, A; McAlister, SP; Chang, CY; Tseng, C; Liang, V; Chen, JK; Chien, SC; Duh, DS; Lin, WJ; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2003Microwave coplanar filters on Si substratesChan, KT; Chin, A; Kuo, JT; Chang, CY; Duh, DS; Lin, WJ; Zhu, CX; Li, MF; Kwong, DL; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2003The minimum noise figure and mechanism as scaling RF MOSFETs from 0.18 to 0.13 mu m technology nodesHuang, CH; Chan, KT; Chen, CY; Chin, A; Huang, GW; Tseng, C; Liang, V; Chen, JK; Chien, SC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2003RF passive devices on Si with excellent performance close to ideal devices designed by electro-magnetic simulationChin, A; Chan, KT; Huang, CH; Chen, C; Liang, V; Chen, JK; Chien, SC; Sung, SW; Duh, DS; Lin, WJ; Zhu, CX; Li, MF; McAlister, SP; Kwong, DL; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Apr-2001The strong degradation of 30 angstrom gate oxide integrity contaminated by copperLin, YH; Chen, YC; Chan, KT; Pan, FM; Hsieh, IJ; Chin, A; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2001Transmission line noise from standard and proton-implanted SiChan, KT; Chin, A; Kwei, CM; Shien, DT; Lin, WJ; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics