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Issue DateTitleAuthor(s)
1-Aug-2000Forward gated-diode measurement of filled traps in high-field stressed thin oxidesChen, MJ; Kang, TK; Huang, HT; Liu, CH; Chang, YJ; Fu, KY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Feb-1996High gain p-n-p gated lateral bipolar action in a fully depleted counter-type: Channel p-MOSFET structureHo, JS; Huang, TH; Chen, MJ; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1996Holographic polarization-selective elements in optical network applicationsHuang, YT; Lin, MF; Deng, JS; Fan, KT; Chen, MJ; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Jul-2004Improved subthreshold slope method for precise extraction of gate capacitive coupling coefficients in stacked gate and source-side injection flash memory cellsCho, CYS; Chen, MJ; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Jan-2001Low-frequency noise in n-channel metal-oxide-semiconductor field-effect transistors undergoing soft breakdownChen, MJ; Kang, TK; Lee, YH; Liu, CH; Chang, YJ; Fu, KY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Dec-1996Low-temperature characteristics of well-type guard rings in epitaxial CMOSHuang, CY; Chen, MJ; Jeng, JK; Wu, CY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Mar-1998A model for low-temperature operation of minority-carrier well-type guard rings in epitaxial CMOS structuresHuang, CY; Chen, MJ; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Jan-2005Modeling mechanical stress effect on dopant diffusion in scaled MOSFETsSheu, YM; Yang, SJ; Wang, CC; Chang, CS; Huang, LP; Huang, TY; Chen, MJ; Diaz, CH; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Apr-2000Monte Carlo sphere model for effective oxide thinning induced extrinsic breakdownHuang, HT; Chen, MJ; Chen, JH; Su, CW; Hou, CS; Liang, MS; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Jul-1996Multiple-training bi-directional adaptive equalizers for TDMA digital cellular systemsChen, MJ; Shung, CB; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Jul-1996Multiple-training bi-directional adaptive equalizers for TDMA digital cellular systemsChen, MJ; Shung, CB; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Jul-2002A new process-variation-immunity method for extracting capacitance coupling coefficients in flash memory cellsCho, CYS; Chen, MJ; Lin, JH; Chen, CF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Feb-1996A new quantitative model for weak inversion charge injection in MOSFET analog switchesGu, YB; Chen, MJ; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Jul-1999A novel cross-coupled inter-poly-oxide capacitor for mixed-mode CMOS processesChen, MJ; Hou, CS; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Mar-2006A novel self-aligned highly reliable sidewall split-gate flash memoryCho, CYS; Chen, MJ; Chen, CF; Tuntasood, P; Fan, DT; Liu, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Oct-2001Numerical confirmation of inelastic trap-assisted tunneling (ITAT) as SILC mechanismKang, TK; Chen, MJ; Liu, CH; Chang, YJ; Fan, SK; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
28-Oct-2002On-off switching of edge direct tunneling currents in metal-oxide-semiconductor field-effect transistorsChen, MJ; Lu, MP; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-May-1996Optimizing the match in weakly inverted MOSFET's by gated lateral bipolar actionChen, MJ; Ho, JS; Chang, DY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
24-Jul-2000Oxide thinning percolation statistical model for soft breakdown in ultrathin gate oxidesChen, MJ; Kang, TK; Liu, CH; Chang, YJ; Fu, KY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Dec-2005Oxide-trap-enhanced Coulomb energy in a metal-oxide-semiconductor systemLu, MP; Chen, MJ; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
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