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學術出版;;Publications
會議論文;;Conferences Paper
Testable design and testing of MCMs based on multifrequency scan
Testable design and testing of MCMs based on multifrequency scan
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Date
1996
Authors
Tseng, WD
Wang, KC
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https://ir.lib.nycu.edu.tw/handle/11536/19838
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會議論文;;Conferences Paper
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