單電荷與輻射效應在先進CMOS 和SONOS 元件可靠性之統計量測與模式

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2013

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https://www.grb.gov.tw/search/planDetail?id=3086423&docId=415027
 https://ir.lib.nycu.edu.tw/handle/11536/88422

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研究計畫;;Research Plans

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