Phase-modulated ellipsometry for probing the temperature-induced phase transition in ruthenium-doped lead zinc niobate-lead titanate single crystal
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10.1016/j.tsf.2010.12.085
Abstract
Phase-modulated ellipsometry was applied to measure changes in the refractive index of pure and ruthenium (Ru)-doped 0.9Pb (Zn(1/3)Nb(2/3))O(3)(PZN)-0.1 PbTiO(3) (PT) during the heating process in real time. Both samples were heated from room temperature to 200 degrees C in a thermally insulated chamber. In both samples, the phase transitions were observed to change from tetragonal to cubic. The temperature region at which the phase transition (Curie region) of Ru-doped 0.9PZN-0.1PT occurred not only broadened but also shifted to a lower temperature. The refractive indices were extremely stable in this region, meaning that Ru-doped 0.9PZN-0.117 is a more favorable medium for the fabrication of optical memories. (C) 2011 Elsevier B.V. All rights reserved.