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ANALYSIS OF THE DX TRAPS INDUCED TRANSIENT CHARACTERISTICS IN ALGAAS GAAS HEMTS

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Date

1990-08-01

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10.1016/0038-1101(90)90223-2

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http://dx.doi.org/10.1016/0038-1101(90)90223-2
 https://ir.lib.nycu.edu.tw/handle/11536/4057

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期刊論文;;Articles

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