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ELECTRICAL CHARACTERIZATION OF ARSENIC-ION-IMPLANTED SEMIINSULATING GAAS BY CURRENT-VOLTAGE MEASUREMENT

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Date

1994-12-19

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DOI

10.1063/1.112434

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http://dx.doi.org/10.1063/1.112434
 https://ir.lib.nycu.edu.tw/handle/11536/2173

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期刊論文;;Articles

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