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學術出版;;Publications
會議論文;;Conferences Paper
Inversion MOS capacitance extraction for ultra-thin gate oxide using BSIM4
Inversion MOS capacitance extraction for ultra-thin gate oxide using BSIM4
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Date
2005
Authors
Lee, W
Su, KW
Chiang, CS
Liu, S
Su, P
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https://ir.lib.nycu.edu.tw/handle/11536/18052
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