積層式氧化鋅變阻器衰化現象之研究

Date

Authors

TSEUNG-YUENTSENG

Keywords

積層式氧化鋅變阻器, 衰化, 深陷能階, Multilayer chip ZnO varistor, Degradation, Deep level transient spectroscopy

URI

https://www.grb.gov.tw/search/planDetail?id=207091&docId=36607
https://ir.lib.nycu.edu.tw/handle/11536/95816

Collections

研究計畫;;Research Plans