Growth of nonpolar (11(2)over-bar0) ZnO films on LaAlO(3) (001) substrates

Abstract

Nonpolar (11 (2) over bar0) ZnO films were grown on LaAlO(3) (001) single crystal substrates at temperature from 300 to 750 S C by pulsed laser deposition method. The films were examined using x-ray diffraction, reflection high energy electron diffraction, and photoluminescence measurements for the crystallinity. The surface morphology of ZnO films from atomic force microscopy exhibits L-shaped domains. Cross-sectional transmission electron microscopy with selected area diffraction reveals two types of a-plane ZnO domains perpendicular to each other with in-plane orientation relationships of [0001](ZnO)[1 (1) over bar0](LAO) and [1 (1) over bar 00](ZnO)[1 (1) over bar0](LAO). (C) 2008 American Institute of Physics.