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IMPROVEMENT OF ELECTRICAL CHARACTERISTICS OF POLYCRYSTALLINE SILICON-CONTACTED DIODES AFTER FORWARD BIAS STRESSING

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Date

1990-10-29

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DOI

10.1063/1.104007

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http://dx.doi.org/10.1063/1.104007
 https://ir.lib.nycu.edu.tw/handle/11536/3984

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期刊論文;;Articles

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