Synchrotron Radiation Soft X-ray Induced Reduction in Graphene Oxide Characterized by Time-Resolved Photoelectron Spectroscopy

Abstract

Synchrotron radiation soft X-ray was employed to reduce graphene oxide (GO) films in ultrahigh vacuum. The dissociation of oxygen-containing functional groups, and the formation of sp(2) C-C bonds were revealed by time-resolved in situ X-ray photoelectron spectroscopy, demonstrating the X-ray reduction of GO. The number of C-O bonds of G-O exhibited an exponential decay with exposure time. The X-ray reduction rate of G-O was positively correlated with the intensity of low-energy secondary electrons excited from substrates by soft X-ray, indicating the C-O bonds were dissociated by secondary electrons.