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學術出版;;Publications
期刊論文;;Articles
REFRACTIVE-INDEX PROFILE MEASUREMENT OF COMPOUND THIN-FILMS BY ELLIPSOMETRY
REFRACTIVE-INDEX PROFILE MEASUREMENT OF COMPOUND THIN-FILMS BY ELLIPSOMETRY
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Date
1989-08-03
Authors
HO, JH
LEE, CL
LEI, TF
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https://ir.lib.nycu.edu.tw/handle/11536/4310
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