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學術出版;;Publications
會議論文;;Conferences Paper
A 45nm 6b/cell Charge-Trapping Flash Memory Using LDPC-Based ECC and Drift-Immune Soft-Sensing Engine
A 45nm 6b/cell Charge-Trapping Flash Memory Using LDPC-Based ECC and Drift-Immune Soft-Sensing Engine
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Date
2013-01-01
Authors
Ho, Kin-Chu
Fang, Po-Chao
Li, Hsiang-Pang
Wang, Cheng-Yuan Michael
Chang, Hsie-Chia
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https://ir.lib.nycu.edu.tw/handle/11536/129819
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