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學術出版;;Publications
會議論文;;Conferences Paper
Impacts of a buffer layer and hi-wafers on the performance of strained-channel NMOSFETs with SiN capping layer
Impacts of a buffer layer and hi-wafers on the performance of strained-channel NMOSFETs with SiN capping layer
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Date
2007
Authors
Tsai, Tzu-, I
Lee, Yao-Jen
Chen, King-Sheng
Wang, Jeff
Wan, Chia-Chen
Hsueh, Fu-Kuo
Lin, Horng-Chih
Chao, Tien-Sheng
Huang, Tiao-Yuan
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https://ir.lib.nycu.edu.tw/handle/11536/135142
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