氫效應在異質接面電晶體所引起的穩定性及可靠性問題

Title:	氫效應在異質接面電晶體所引起的穩定性及可靠性問題 Hydrogen Related Stability and Reliability Issues of GaAs Based HBTs
Authors:	李建平 LEE CHIEN-PING 交通大學電子工程系
Keywords:	異質接面電晶體;有機金屬化學氣相沈積法;可靠度;HBT;MOCVD;Reliability
Issue Date:	2000
Gov't Doc #:	NSC89-2215-E009-060
URI:	http://hdl.handle.net/11536/101127 https://www.grb.gov.tw/search/planDetail?id=542135&docId=99591
Appears in Collections:	Research Plans