Title: | III-V metal-oxide-semiconductor device |
Authors: | Chang Edward Yi Lin Yueh-Chin |
Issue Date: | 27-Aug-2013 |
Abstract: | A hafnium oxide layer, between a III-V semiconductor layer and a metal oxide layer is used to prevent interaction between the III-V semiconductor layer and the metal oxide layer. |
Gov't Doc #: | H01L021/02 |
URI: | http://hdl.handle.net/11536/104450 |
Patent Country: | USA |
Patent Number: | 08519488 |
Appears in Collections: | Patents |
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