Title: III-V metal-oxide-semiconductor device
Authors: Chang Edward Yi
Lin Yueh-Chin
Issue Date: 27-Aug-2013
Abstract: A hafnium oxide layer, between a III-V semiconductor layer and a metal oxide layer is used to prevent interaction between the III-V semiconductor layer and the metal oxide layer.
Gov't Doc #: H01L021/02
URI: http://hdl.handle.net/11536/104450
Patent Country: USA
Patent Number: 08519488
Appears in Collections:Patents


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