Title: Method for forming a GexSi1-x buffer layer of solar-energy battery on a silicon wafer
Authors: Chang Edward Yi
Tang Shih-Hsuan
Lin Yue-Cin
Issue Date: 11-Oct-2011
Abstract: The method is disclosed that Si+ is implanted on Si substrate to enhance strain relaxation at the interface between the metamorphic GexSi1−x buffer layers and Si substrate, in order to facilitate the growth of a high quality Ge on Si substrate. And several GexSi1−x buffer layers (Si/Ge0.8Si0.2/Ge0.9Si0.1/Ge) are grown on top of Si substrate by UHVCVD. Then grow pure Ge layer of low dislocation density on GexSi1−x buffer layer. Finally, grow up high efficiency III-V solar cell on GexSi1−x buffer layer.
Gov't Doc #: H01L021/00
URI: http://hdl.handle.net/11536/104636
Patent Country: USA
Patent Number: 08034654
Appears in Collections:Patents


Files in This Item:

  1. 08034654.pdf

If it is a zip file, please download the file and unzip it, then open index.html in a browser to view the full text content.