Title: Cu-metalized compound semiconductor device
Authors: Chang
Edward Yi
Chang
Shang-Wen
Lee
Cheng-Shih
Issue Date: 2-Sep-2008
Abstract: The present invention is a compound semiconductor device characterized in that it is Cu-metalized to improved the reliability of the device and to greatly reduce the cost of production.
Gov't Doc #: H01L023/48
H01L029/40
H01L021/02
H01L023/52
H01L029/66
URI: http://hdl.handle.net/11536/104763
Patent Country: USA
Patent Number: 07420227
Appears in Collections:Patents


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