Title: | Stacked Gate Structure, Metal-Oxide-Semiconductor Including the Same, and Method for Manufacturing the Stacked Gate Structure |
Authors: | LIN Yueh-Chin CHANG Edward Yi CHUANG Ting-Wei |
Issue Date: | 5-Jun-2014 |
Abstract: | The invention provides a stacked gate structure and metal-oxide-semiconductor including the same, and method for manufacturing the stacked gate structure. The stacked gate structure comprises a substrate, a semiconductor layer positioned on the substrate, a gate dielectric positioned on the semiconductor layer, and a gate electrode layer positioned on the gate dielectric, which the gate dielectric comprises a composite oxide layer composed of lanthanum oxide (La2O3) and hafnium oxide (HfO2). |
Gov't Doc #: | H01L029/78 H01L021/28 |
URI: | http://hdl.handle.net/11536/104912 |
Patent Country: | USA |
Patent Number: | 20140151710 |
Appears in Collections: | Patents |
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