專利侵害責任範圍因果關係的合理詮釋與再建構

Title:	專利侵害責任範圍因果關係的合理詮釋與再建構
Authors:	沈宗倫 Shen, Chung-lun 科技法律研究所 Institute of Technology Law
Keywords:	專利損害賠償;相當因果關係;完全市場價值法則;等同權利金;不當得利;Patent damage;Causation;The entire market value rule;Equivalent royalty;Unjust enrichment
Issue Date:	2011
URI:	http://hdl.handle.net/11536/107623 http://www.itl.nctu.edu.tw/tlr_n/ch/list8_1.html
ISSN:	1811-3095
Journal:	科技法學評論
Volume:	8
Issue:	1
Begin Page:	1
End Page:	56
Appears in Collections:	Technology Law Review

Files in This Item:

If it is a zip file, please download the file and unzip it, then open index.html in a browser to view the full text content.