Title: 專利之有效性與侵害訴訟--以比較法研究為中心
Authors: 黃麟倫
Hwang, Lin-lun
科技法律研究所
Institute of Technology Law
Keywords: 專利有效性;舉發;無效訴訟;侵權訴訟;再審查;Patent validity;Invalidation action;Invalidation litigation;Infringement litigation;Re-examination
Issue Date: 2006
URI: http://hdl.handle.net/11536/107688
https://lawreview.nctu.edu.tw/issues/
ISSN: 1811-3095
Journal: 科技法學評論
Volume: 3
Issue: 2
Begin Page: 169
End Page: 202
Appears in Collections:Technology Law Review


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