Title: Post flight analysis of the surface plasmon resonance enhanced photoelastic modulated ellipsometry
Authors: Chao, Yu-Faye
Han, Chien-Yuan
光電工程學系
Department of Photonics
Keywords: ellipsometry;surface plasmon resonance;photoelastic modulator
Issue Date: 20-Feb-2007
Abstract: A total internal reflection ellipsometer equipped with a photoelastic modulator (PEM) is installed to investigate the chemical activation and antibody immobilization process on thin gold films. We set up two detection channels in this configuration: one for real-time monitoring with a data rate of 1 set per second, and the other for post flight analysis with a data rate of 25,000 sets per second. More detailed information has been obtained through the post flight analysis technique during the chemical activation process. This surface plasmon resonance enhanced PEM ellipsometry provides higher sensitivity and temporal resolution. It is feasible to resolve a faster reaction such as chemical reaction or protein folding by the post flight analysis technique. (c) 2006 Elsevier B.V. All rights reserved.
URI: http://dx.doi.org/10.1016/j.snb.2006.04.073
http://hdl.handle.net/11536/11115
ISSN: 0925-4005
DOI: 10.1016/j.snb.2006.04.073
Journal: SENSORS AND ACTUATORS B-CHEMICAL
Volume: 121
Issue: 2
Begin Page: 490
End Page: 495
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