Title: High-temperature magnetoresistance study of a magnetic tunnel junction
Authors: Chen, D. C.
Yao, Y. D.
Chen, C. M.
Hung, James
Chen, Y. S.
Wang, W. H.
Chen, W. C.
Kao, M. J.
材料科學與工程學系
Department of Materials Science and Engineering
Keywords: Magnetic tunnel junction;Tunneling magnetoresistance;Temperature dependence;Thermal annealing
Issue Date: 1-Sep-2006
Abstract: The thermal stability and the spin transportation phenomenon at room temperature and 140 degrees C of a series of magnetic tunneling junctions with the structure of bottom electrode/PtMn/Pinned layer/ AlO(x)/CoFe/NiFe/top electrode have been investigated. The MR ratio decreases from 33.5% at room temperature to 29% at 140 degrees C. The MR ratio at room temperature increases roughly 0.8% after thermal treatment at temperatures above 60 degrees C. This is related to the thermal relaxation of the strains existing in the samples. (C) 2006 Elsevier B.V. All rights reserved.
URI: http://dx.doi.org/10.1016/j.jmmm.2006.02.062
http://hdl.handle.net/11536/11837
ISSN: 0304-8853
DOI: 10.1016/j.jmmm.2006.02.062
Journal: JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
Volume: 304
Issue: 1
Begin Page: E297
End Page: E299
Appears in Collections:Articles


Files in This Item:

  1. 000207211700098.pdf

If it is a zip file, please download the file and unzip it, then open index.html in a browser to view the full text content.