Title: Numerical study of the subtraction threshold for fluorescence difference microscopy
Authors: Wang, Nan
Kobayashi, Takayoshi
電子物理學系
Department of Electrophysics
Issue Date: 17-Nov-2014
Abstract: Subtraction microscopy has recently been promoted for its compactness and simplicity of enhancing spatial resolution. However, until now, the subtraction factors used in such microscopes to process raw images have been chosen experientially, and it has been impossible to determine whether the resolved structures after subtraction are appropriate or over-processed. Based on vector diffraction theory and two-dimensional convolution, this paper presents numerical investigations of the parameters that may offer the selection criterion of subtraction factors used in subtraction microscopy. It proposes two essential parameters for appropriately evaluating the subtraction factor: the fluorescence peak intensity after subtraction and resolution derivative. (C) 2014 Optical Society of America
URI: http://dx.doi.org/10.1364/OE.22.028819
http://hdl.handle.net/11536/123901
ISSN: 1094-4087
DOI: 10.1364/OE.22.028819
Journal: OPTICS EXPRESS
Volume: 22
Issue: 23
Begin Page: 28819
End Page: 28830
Appears in Collections:Articles


Files in This Item:

  1. 7c5633557c106421f92d5f8855aaff84.pdf

If it is a zip file, please download the file and unzip it, then open index.html in a browser to view the full text content.