Title: Memcomputing: the Cape of Good Hope
Authors: Shi, Yiyu
Chen, Hung-Ming
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
Issue Date: 1-Jan-2014
Abstract: 
URI: http://hdl.handle.net/11536/125144
ISBN: 978-3-9815370-2-4
ISSN: 1530-1591
Journal: 2014 DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION (DATE)
Appears in Collections:Conferences Paper