A 45nm 6b/cell Charge-Trapping Flash Memory Using LDPC-Based ECC and Drift-Immune Soft-Sensing Engine

Title:	A 45nm 6b/cell Charge-Trapping Flash Memory Using LDPC-Based ECC and Drift-Immune Soft-Sensing Engine
Authors:	Ho, Kin-Chu Fang, Po-Chao Li, Hsiang-Pang Wang, Cheng-Yuan Michael Chang, Hsie-Chia 交大名義發表 National Chiao Tung University
Issue Date:	1-Jan-2013
Abstract:
URI:	http://hdl.handle.net/11536/129819
ISBN:	978-1-4673-4513-2; 978-1-4673-4515-6
ISSN:	0193-6530
Journal:	2013 IEEE INTERNATIONAL SOLID-STATE CIRCUITS CONFERENCE DIGEST OF TECHNICAL PAPERS (ISSCC)
Volume:	56
Begin Page:	222
End Page:	U1056
Appears in Collections:	Conferences Paper