Title: High Mobility MoS2 Transistor with Low Schottky Barrier Contact by Using Atomic Thick h-BN as a Tunneling Layer
Authors: Wang, Jingli
Yao, Qian
Huang, Chun-Wei
Zou, Xuming
Liao, Lei
Chen, Shanshan
Fan, Zhiyong
Zhang, Kai
Wu, Wei
Xiao, Xiangheng
Jiang, Changzhong
Wu, Wen-Wei
材料科學與工程學系
Department of Materials Science and Engineering
Keywords: contact resistance;hexagonal boron nitride;MoS2;tunneling
Issue Date: 5-Oct-2016
Abstract: High-performance MoS2 transistors are developed using atomic hexagonal boron nitride as a tunneling layer to reduce the Schottky barrier and achieve low contact resistance between metal and MoS2. Benefiting from the ultrathin tunneling layer within 0.6 nm, the Schottky barrier is significantly reduced from 158 to 31 meV with small tunneling resistance.
URI: http://dx.doi.org/10.1002/adma.201602757
http://hdl.handle.net/11536/132647
ISSN: 0935-9648
DOI: 10.1002/adma.201602757
Journal: ADVANCED MATERIALS
Volume: 28
Issue: 37
Begin Page: 8302
End Page: 8308
Appears in Collections:Articles