Title: The Experimental Study of THz Image Sensor in 0.18 mu m CMOS Technology
Authors: Lai, Chih-Wei
Chen, Wei-Cheng
Yan, Tzu-Chao
Li, Chun-Hsing
Kuo, Chien-Nan
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
Keywords: TIIz image;power detector;CMOS;responsivity
Issue Date: 2014
Abstract: In this study, four different types of power detectors are implemented in 0.18 mu m CMOS technology for the THz image sensor application. These power detectors include common-source with and without supply voltage, and common gate with and without supply voltage. The measured responsivities at 332 GHz are 632 kV/W, 13.2 kV/W, 16.2 kV/W, and 9.1 kV/W, respectively. The image resolution of the proposed THz sensor is 2 mm.
URI: http://hdl.handle.net/11536/136122
ISBN: 978-4-9023-3931-4
Journal: 2014 ASIA-PACIFIC MICROWAVE CONFERENCE (APMC)
Begin Page: 148
End Page: 150
Appears in Collections:Conferences Paper