Title: On-Chip ESD Protection Design for HV Integrated Circuits
Authors: Ker, Ming-Dou
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
Keywords: ESD protection;high-voltage (HI) IC
Issue Date: 2016
Abstract: Electrostatic discharge (ESD) protection has been an important reliability issue to CMOS integrated circuits, especially in high-voltage (HV) applications. In this invited talk, a brief overview on ESD protection designs for HV integrated circuits is presented. The useful and safe solutions are highlighted for real applications in HV IC products.
URI: http://hdl.handle.net/11536/136468
ISBN: 978-1-4673-8969-3
ISSN: 2159-3523
Journal: 7TH IEEE INTERNATIONAL NANOELECTRONICS CONFERENCE (INEC) 2016
Appears in Collections:Conferences Paper