Title: Comparison of Parasitic Capacitances of Packaged Cascode Gallium Nitride Field-efect Transistors
Authors: Wu, Chih-Chiang
Jeng, Shyr-Long
機械工程學系
Department of Mechanical Engineering
Keywords: gallium nitride;cascode;parasitic capacitance
Issue Date: 1-Jan-2018
Abstract: In this work, we examined the electrical characteristics of laboratory-fabricated cascode gallium nitride field-effect transistors (GaN FETs) and analyzed their parasitic capacitances. The calculated results were in good agreement with the experimental results and showed that commercial GaN FETs have superior switching performance, whereas laboratory-fabricated GaN FETs require further improvement.
URI: http://dx.doi.org/10.18494/SAM.2018.1746
http://hdl.handle.net/11536/144934
ISSN: 0914-4935
DOI: 10.18494/SAM.2018.1746
Journal: SENSORS AND MATERIALS
Volume: 30
Issue: 1
Begin Page: 453
End Page: 461
Appears in Collections:Articles