Title: | Atomic-scale epitaxial aluminum film on GaAs substrate |
Authors: | Fan, Yen-Ting Lo, Ming-Cheng Wu, Chu-Chun Chen, Peng-Yu Wu, Jenq-Shinn Liang, Chi-Te Lin, Sheng-Di 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
Issue Date: | 1-Jul-2017 |
Abstract: | Atomic-scale metal films exhibit intriguing size-dependent film stability, electrical conductivity, superconductivity, and chemical reactivity. With advancing methods for preparing ultra-thin and atomically smooth metal films, clear evidences of the quantum size effect have been experimentally collected in the past two decades. However, with the problems of small-area fabrication, film oxidation in air, and highly-sensitive interfaces between the metal, substrate, and capping layer, the uses of the quantized metallic films for further ex-situ investigations and applications have been seriously limited. To this end, we develop a large-area fabrication method for continuous atomic-scale aluminum film. The self-limited oxidation of aluminum protects and quantizes the metallic film and enables ex-situ characterizations and device processing in air. Structure analysis and electrical measurements on the prepared films imply the quantum size effect in the atomic-scale aluminum film. Our work opens the way for further physics studies and device applications using the quantized electronic states in metals. (C) 2017 Author(s). |
URI: | http://dx.doi.org/10.1063/1.4991435 http://hdl.handle.net/11536/145866 |
ISSN: | 2158-3226 |
DOI: | 10.1063/1.4991435 |
Journal: | AIP ADVANCES |
Volume: | 7 |
Issue: | 7 |
Begin Page: | 0 |
End Page: | 0 |
Appears in Collections: | Articles |
Files in This Item:
If it is a zip file, please download the file and unzip it, then open index.html in a browser to view the full text content.