Title: Reading between the ratings: Modeling residual credit risk and yield overlap
Authors: Chang, Charles
Fuh, Cheng-Der
Kao, Chu-Lan Michael
統計學研究所
Institute of Statistics
Keywords: Credit rating;Yield curve;Markov model
Issue Date: 1-Aug-2017
Abstract: Credit ratings group firms by risk, yet yields are shown to overlap between firms of adjacent ratings. We model this by considering the residual risk arising from differences in the parameters of each firm's value process for firms with the same rating. To do so, our framework simultaneously incorporates jump default with Markov-governed likelihoods and continuous defaults in a default-barrier framework. We provide closed-form approximations for expected default time and tail probabilities, and empirically fit the S-shaped yield curve, intra-rating spread, and inter-rating overlap. Results are robust to time period, rating system, sub-rating, and common characteristics such as liquidity. (C) 2017 Published by Elsevier B.V.
URI: http://dx.doi.org/10.1016/j.jbankfin.2017.04.011
http://hdl.handle.net/11536/145913
ISSN: 0378-4266
DOI: 10.1016/j.jbankfin.2017.04.011
Journal: JOURNAL OF BANKING & FINANCE
Volume: 81
Begin Page: 114
End Page: 135
Appears in Collections:Articles