Title: | MAUI: Making Aging Useful, Intentionally |
Authors: | Wu, Kai-Chiang Tseng, Tien-Hung Li, Shou-Chun 資訊工程學系 Department of Computer Science |
Issue Date: | 1-Jan-2018 |
Abstract: | Device aging, which causes significant loss on circuit performance and lifetime, has been a primary factor in reliability degradation of nanoscale designs. In this paper, we propose to take advantage of aging-induced clock skews (i.e., make them useful for aging tolerance) by manipulating these lime-varying skews to compensate for the performance degradation of logic networks. The goal is to assign achievable/reasonable aging-induced clock skews in a circuit, such that its overall performance degradation due to aging can be minimized, that is, the lifespan can be maximized. On average, 25% aging tolerance can be achieved with insignificant design overhead. |
URI: | http://hdl.handle.net/11536/146203 |
ISSN: | 1530-1591 |
Journal: | PROCEEDINGS OF THE 2018 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE) |
Begin Page: | 527 |
End Page: | 532 |
Appears in Collections: | Conferences Paper |