| Title: | THE STUDY OF APPARENT NEGATIVE VALUE IN MEASURING DIELECTRIC LOSS |
| Authors: | LIU, YN LIU, CC |
| Issue Date: | 1-Jan-1982 |
| URI: | http://hdl.handle.net/11536/149054 |
| ISSN: | 0018-9367 |
| Journal: | IEEE TRANSACTIONS ON ELECTRICAL INSULATION |
| Volume: | 17 |
| Begin Page: | 20 |
| End Page: | 26 |
| Appears in Collections: | Articles |
- THE STUDY OF APPARENT NEGATIVE VALUE IN MEASURING DIELECTRIC LOSS / LIU, YN;LIU, CC
- A novel TDR signal processing technique for measuring apparent dielectric spectrum / Lin, Chih-Ping;Ngui, Yin Jeh;Lin, Chun-Hung
- Dielectric tunability of barium strontium titanate films prepared by a sol-gel method / Nayak, M;Tseng, TY
- Characteristics of the Fluorinated High-k Inter-Poly Dielectrics / Hsieh, Chih-Ren;Chen, Yung-Yu;Lu, Kwung-Wen;Lin, Gray;Lou, Jen-Chung
- Dielectric relaxation and defect analysis of Ta2O5 thin films / Ezhilvalavan, S;Tsai, MS;Tseng, TY
- An improved two-frequency method of capacitance measurement for SrTiO3 as high-k gate dielectric / Lue, HT;Liu, CY;Tseng, TY
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