Title: Improved technique for measuring small angles
Authors: Chiu, MH
Su, DC
光電工程研究所
Institute of EO Enginerring
Keywords: total-internal-reflection effect;heterodyne interferometry
Issue Date: 1-Oct-1997
Abstract: Based on the total-internal-reflection effect and heterodyne interferometry, an improved technique for measuring small angles is proposed. This technique not only expands the measurement range but it also improves measurement performances. Its validity is demonstrated. (C) 1997 Optical Society of America.
URI: http://dx.doi.org/10.1364/AO.36.007104
http://hdl.handle.net/11536/149647
ISSN: 0003-6935
DOI: 10.1364/AO.36.007104
Journal: APPLIED OPTICS
Volume: 36
Begin Page: 7104
End Page: 7106
Appears in Collections:Articles