Title: Nanoscale 2-Bit/Cell HfO2 Nanocrystal Flash Memory
Authors: Lin, Yu-Hsien
Chien, Chao-Hsin
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
Keywords: Flash memory;hafnium oxide;nanocrystals;nonvolatile memories
Issue Date: 1-Mar-2012
Abstract: In this paper, we demonstrate 50-nm trigate nonvolatile HfO2 nanocrystal memory devices on silicon-on-insulator wafers. The proposed technique, which is fully compatible with current CMOS technologies, is used to form highly localized HfO2 nanocrystals for application in nonvolatile flash memory. We successfully scale down conventional nonvolatile floating gate memories below the 50-nm node to achieve nanodevices for application in next-generation nonvolatile memories.
URI: http://dx.doi.org/10.1109/TNANO.2011.2179062
http://hdl.handle.net/11536/15835
ISSN: 1536-125X
DOI: 10.1109/TNANO.2011.2179062
Journal: IEEE TRANSACTIONS ON NANOTECHNOLOGY
Volume: 11
Issue: 2
Begin Page: 412
End Page: 417
Appears in Collections:Articles


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