Title: | Effects of semiconductor processing chemicals on conductivity of graphene |
Authors: | Chen, Chung Wei Ren, F. Chi, Gou-Chung Hung, S. C. Huang, Y. P. Kim, Jihyun Kravchenko, Ivan Pearton, Stephen J. 光電工程學系 Department of Photonics |
Issue Date: | 1-Jul-2012 |
Abstract: | "Graphene layers on SiO2/Si substrates were exposed to chemicals or gases commonly used in semiconductor fabrication processes, including solvents (isopropanol, acetone), acids, bases (ammonium hydroxide), UV ozone, H2O, and O-2 plasmas. The recovery of the initial graphene properties after these exposures was monitored by measuring both the layer resistance and Raman 2D peak position as a function of time in air or vacuum. Solvents and UV ozone were found to have the least affect, while oxygen plasma exposure caused an increase of resistance of more than 3 orders of magnitude. Recovery is accelerated under vacuum but changes can persist for more than 5 h. Careful design of fabrication schemes involving graphene is necessary to minimize these interactions with common processing chemicals. (C) 2012 American Vacuum Society. [http://dx.doi.org/10.1116/1.4732517]" |
URI: | http://dx.doi.org/40602 http://hdl.handle.net/11536/16761 |
ISSN: | 1071-1023 |
DOI: | 40602 |
Journal: | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B |
Volume: | 30 |
Issue: | 4 |
End Page: | |
Appears in Collections: | Articles |
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