A novel LCD driver testing technique using logic test channels

Title:	A novel LCD driver testing technique using logic test channels
Authors:	Su, CC Wang, WJ Wang, CH Tseng, IS 電控工程研究所 Institute of Electrical and Control Engineering
Issue Date:	2003
Abstract:	This paper proposes a novel voltage measurement technique for LCD driver testing by the use of logic test channel of an ATE. The method is able to achieve less than 1mV error with the presence of 32mV RMS noise.
URI:	http://hdl.handle.net/11536/18577
ISBN:	0-7803-7659-5
Journal:	ASP-DAC 2003: PROCEEDINGS OF THE ASIA AND SOUTH PACIFIC DESIGN AUTOMATION CONFERENCE
Begin Page:	657
End Page:	662
Appears in Collections:	Conferences Paper