Title: | A methodology for fault model development for hierarchical linear systems |
Authors: | Huang, YC Lee, CL Lin, JW Chen, JE Su, CC 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
Issue Date: | 2000 |
Abstract: | In this paper, a methodology to develop fault models for hierarchical linear systems which are composed of operational amplifiers(OP) is demonstrated and presented. The methodology, at first, presents a transfer function model for the open-loop OP based on analysis of element faults at the transistor level. Then it derives a transfer function model for the closed loop OP based on the derived open-loop OP level model, again a higher level fault model for a module which is composed of closed loop OPs. The models can handle ac faults. The benchmark state-variable filter is used as an example to demonstrate for this methodology. an application of the derived models to Monte-Carlo simulation to save computation time is also demonstrated. |
URI: | http://hdl.handle.net/11536/19234 |
ISBN: | 0-7695-0888-X |
Journal: | PROCEEDINGS OF THE NINTH ASIAN TEST SYMPOSIUM (ATS 2000) |
Begin Page: | 90 |
End Page: | 95 |
Appears in Collections: | Conferences Paper |