Title: | The performance limiting factors as RF MOSFETs scaling down |
Authors: | Wu, YH Chin, A Liang, CS Wu, CC 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
Issue Date: | 2000 |
Abstract: | The measured RF performance of 0.5, 0.25, and 0.18 mum MOSFETs gradually saturates as scaling down, which can be explained by the derived analytical equation and simulation. The overlap C-gd and non-quasi-static effect are the main factors but scales much slower than L-g. |
URI: | http://hdl.handle.net/11536/19272 http://dx.doi.org/10.1109/RFIC.2000.854437 |
ISBN: | 0-7803-6281-0 |
DOI: | 10.1109/RFIC.2000.854437 |
Journal: | 2000 IEEE RADIO FREQUENCY INTEGRATED CIRCUITS (RFIC) SYMPOSIUM, DIGEST OF PAPERS |
Begin Page: | 151 |
End Page: | 154 |
Appears in Collections: | Conferences Paper |
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