Testable design and testing of MCMs based on multifrequency scan

Title:	Testable design and testing of MCMs based on multifrequency scan
Authors:	Tseng, WD Wang, KC 資訊工程學系 Department of Computer Science
Issue Date:	1996
URI:	http://hdl.handle.net/11536/19838
ISBN:	0-8186-7478-4
Journal:	PROCEEDINGS OF THE FIFTH ASIAN TEST SYMPOSIUM (ATS '96)
Begin Page:	75
End Page:	80
Appears in Collections:	Conferences Paper