Title: | A SPICE simulation model for field emission triode |
Authors: | Lu, CW Lee, CL Huang, JM 交大名義發表 電子工程學系及電子研究所 National Chiao Tung University Department of Electronics Engineering and Institute of Electronics |
Issue Date: | 1996 |
Abstract: | In this work, a simple but accurate circuit model, which can be incorporated into circuit simulation programs such as SPICE, for field emission triode (FET) is developed. The model is based on the Fowler-Nordheim (F-N) J-E relationship but takes into account the charge distribution on the surface of the tip of the device. A procedure is also developed to extract the parameters of the model. |
URI: | http://hdl.handle.net/11536/19900 |
ISBN: | 0-7803-3594-5 |
Journal: | IVMC '96 - 9TH INTERNATIONAL VACUUM MICROELECTRONICS CONFERENCE, TECHNICAL DIGEST |
Begin Page: | 62 |
End Page: | 66 |
Appears in Collections: | Conferences Paper |