INTEGRATED DIAGNOSIS AND RECONFIGURATION PROCESS FOR DEFECT TOLERANT WSI PROCESSOR ARRAYS

Title:	INTEGRATED DIAGNOSIS AND RECONFIGURATION PROCESS FOR DEFECT TOLERANT WSI PROCESSOR ARRAYS
Authors:	WANG, KC LIN, JW 資訊工程學系 Department of Computer Science
Issue Date:	1994
URI:	http://hdl.handle.net/11536/20106
ISBN:	0-7803-1849-8
ISSN:	1063-2204
Journal:	INTERNATIONAL CONFERENCE ON WAFER SCALE INTEGRATION: IEEE 1994 PROCEEDINGS SIXTH ANNUAL
Begin Page:	198
End Page:	207
Appears in Collections:	Conferences Paper