Title: Near-/Sub-V-th Process, Voltage, and Temperature (PVT) Sensors with Dynamic Voltage Selection
Authors: Chang, Ming-Hung
Lin, Shang-Yuan
Wu, Pei-Chen
Zakoretska, Olesya
Chuang, Ching-Te
Chen, Kuan-Neng
Wang, Chen-Chao
Chen, Kua-Hua
Chiu, Chi-Tsung
Tong, Ho-Ming
Hwang, Wei
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
Keywords: Process;voltage;temperature (PVT) variations;temperature sensor;near-threshold circuit;sub-threshold circuit
Issue Date: 2013
Abstract: A process, voltage and temperature (PVT) sensors with dynamic voltage selection are proposed for environmental management in the ultra-low voltage dynamic voltage and frequency scaling (DVFS) system. The process and voltage (PV) sensors initially monitor the process variation. With known process information, PV sensors can real-time provide voltage variation status. The temperature sensor has six temperature sensitive ring oscillators (TSROs) generating frequency proportional to temperature. It dynamically selects the proper TSRO to convert the frequency into digital readings according to voltage status provided by PV sensors. With known process and voltage information from PV sensors, a pure temperature measurement result can be obtained. The proposed PVT sensors are designed in TSMC 65nm CMOS technology. This work can be dynamically operated over an ultra-low voltage range from 0.25V to 0.5V. Only 2.3 mu W is consumed at 0.25V. They can achieve 0.15 degrees C resolution and 50k samples/sec conversion rate.
URI: http://hdl.handle.net/11536/24128
ISBN: 978-1-4673-5762-3; 978-1-4673-5760-9
ISSN: 0271-4302
Journal: 2013 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS)
Begin Page: 133
End Page: 136
Appears in Collections:Conferences Paper