Title: | Motional Resistance Issue of TSV-Based Resonator Device and Its Improvement With a Concave Cu TSV Structural Design |
Authors: | Shih, Jian-Yu Chen, Yen-Chi Chiu, Chih-Hung Chen, Kuan-Neng 交大名義發表 電子工程學系及電子研究所 National Chiao Tung University Department of Electronics Engineering and Institute of Electronics |
Keywords: | Three-dimensional (3D) integration;concave through silicon via (TSV);motional resistance |
Issue Date: | 1-Aug-2014 |
Abstract: | Motional resistance of TSV-based resonator devices with 3D integration techniques is investigated at the operating oscillating mode. Even with well-developed TSV and device fabrication, the motional resistance issue of the TSV-based resonator device is found due to the poor connected Ag paste. The corresponding solution is demonstrated by a modified concave Cu TSVs structure. This modified concave Cu TSV design shows the excellent device characteristics and no visible gaps between the Cu TSVs and resonator devices to insure a good electrical connection. |
URI: | http://dx.doi.org/10.1109/LED.2014.2327117 http://hdl.handle.net/11536/25228 |
ISSN: | 0741-3106 |
DOI: | 10.1109/LED.2014.2327117 |
Journal: | IEEE ELECTRON DEVICE LETTERS |
Volume: | 35 |
Issue: | 8 |
Begin Page: | 865 |
End Page: | 867 |
Appears in Collections: | Articles |
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