Title: Measuring manufacturing capability for couplers and wavelength division multiplexers
Authors: Wu, CW
Pearn, WL
工業工程與管理學系
Department of Industrial Engineering and Management
Keywords: bootstrap methods;couplers;insertion loss;multiple characteristics;NCPPM;polarization dependent loss;process capability indices;wavelength division multiplexers;yield analysis
Issue Date: 2005
Abstract: The couplers and wavelength division multiplexers have been widely used in high-speed, high-volume image data transmission systems to provide sufficient bandwidth and smaller channel spacing for greater throughput. In this paper, we develop a method for measuring the manufacturing capability of a process making couplers and wavelength division multiplexers. The proposed method measures the process capability of reproducing product items meeting the manufacturing specifications where multiple product quality characteristics are involved, including the polarization dependent loss, and the insertion loss, which are critical in fiber-optic transmission quality.
URI: http://hdl.handle.net/11536/25233
http://dx.doi.org/10.1007/s00170-003-1793-9
ISSN: 0268-3768
DOI: 10.1007/s00170-003-1793-9
Journal: INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY
Volume: 25
Issue: 5-6
Begin Page: 533
End Page: 541
Appears in Collections:Articles


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